Fundamental principles of engineering nanometrology / Richard Leach.

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Material type: Text

TextSeries: Micro & nano technologiesEdition: Second editionDescription: xxi, 361 pages : illustrations ; 25 cmISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	KMTC:LOITOKITOK CAMPUS	T174.7 .L42 2014 (Browse shelf(Opens below))	Available		LTK/2695

Includes bibliographical references and index.

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